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de Broglie waves

Atomic force microscopy

Atomic force microscopy (AFM) can reveal details of the shapes and other properties of surfaces on a nanometre scale

The terms in bold link to topics in the AQA, Edexcel, OCR, WJEC and CCEA A-level specifications, as well as the IB, Pre-U and SQA exam specifications.

AFM techniques use resonance to achieve precise measurements of surfaces, and can be used to study magnetic, thermal and electrical properties of materials.

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